GEOL 656L Scanning Electron Microscopy

Credits: (0-1) 1

A practical introduction to the use of the scanning electron microscope (SEM) intended for geology and geological engineering students. Topics include general design of the scanning electron microscope, control of electron beam parameters for specific applications, image formation and detectors for electron signals, electron-beam induced X-ray generation, and determination of elemental composition. Students provide samples related to their research and submit a brief report on the results of SEM examination.

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