MES 656 Introduction to SEM and FIB

Credits: (1-0) 1

A course focused on examination of materials via dual beam systems. This will include learning the basics of SEM and FIB optics and operation, detectors and their configuration and applications, and conducting experimental work with hands on time using a dual beam FIB-SEM. Students will be encouraged to supply research materials they are currently exploring as part of the course and final project.

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